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Scanning EM Services

Scanning EM ciliaThe facility provides training, assistance or full service in SEM techniques, including sample preparation, (fixation, critical point drying, sputter coating, and metal and carbon evaporation), as well as imaging on the Etec Autoscan scanning microscope.  While Facility capabilities are currently limited to conventional surface imaging by secondary electrons (due to the age of our Etec microscope), we have applied for funds for a new instrument that will provide state-of-the-art technology in the near future if our application is successful.  Meanwhile, limited backscatter and elemental analysis data can sometimes be obtained at other institutions and at the manufacturers’ facilities.